Adding the rest of the matrix scanning modes
- Not tested yet - Added bug fixes for the scanCol and scanRow methods - Merged in the powered versions of scanCol and scanRow - Added the scanDual, but still needs heavy testing - The scanDual uses twice the memory per key, so it can only scan half as much compared to the other scan modes
This commit is contained in:
Jacob Alexander
parent
ab9382acf3
commit
aa77d5d8a4
@ -30,14 +30,32 @@
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// ----- Scan Mode Setting (See matrix_scan.h for more details) -----
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#define scanMode scanCol
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#define scanMode scanDual
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// ----- Key Settings -----
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// -- Example for scanCol --
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/*
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#define KEYBOARD_SIZE 16 // # of keys
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#define MAX_ROW_SIZE 16 // # of keys in the largest row
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#define MAX_COL_SIZE 1 // # of keys in the largest column
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*/
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// -- Example for scanRow --
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/*
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#define KEYBOARD_SIZE 16 // # of keys
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#define MAX_ROW_SIZE 1 // # of keys in the largest row
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#define MAX_COL_SIZE 16 // # of keys in the largest column
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*/
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// -- Example for scanRow_powrCol, scanCol_powrRow, and scanDual --
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#define KEYBOARD_SIZE 69 // # of keys
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#define MAX_ROW_SIZE 8 // # of keys in the largest row
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#define MAX_COL_SIZE 9 // # of keys in the largest column
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@ -54,7 +72,7 @@ static const uint8_t matrix_pinout[][MAX_ROW_SIZE + 1] = {
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// Thus if a row doesn't use all the key positions, you can denote it as 0, which will be ignored/skipped on each scan
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// See the keymap.h file for the various preconfigured arrays.
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// Scan Mode | Col 1 | Col 2 | Col 3 | Col 4 | Col 4 | ...
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// Scan Mode | Col 1 | Col 2 | Col 3 | Col 4 | Col 5 | ...
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// -------------------------------------------------------
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// Row 1 | Key 1 Key 7 Key32 ...
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// Row 2 | Key 3 Key92 ...
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@ -64,13 +82,63 @@ static const uint8_t matrix_pinout[][MAX_ROW_SIZE + 1] = {
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// ... |
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// -- scanCol Example --
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/*
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{ scanMode, pinF0, pinF4, pinB7, pinD3, pinF5, pinF1, pinD1, pinD2, pinF6, pinF7, pinB2, pinD0, pinB0, pinB6, pinB1, pinB3 },
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{ pinNULL, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16 },
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*/
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// Example Rows
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//{ pinE0, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16 },
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//{ pinE1, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 0, 0 },
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// -- scanRow Example --
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/*
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{ scanMode, pinNULL },
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{ pinF0, 1 },
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{ pinF4, 2 },
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{ pinB7, 3 },
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{ pinD3, 4 },
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{ pinF5, 5 },
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{ pinF1, 6 },
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{ pinD1, 7 },
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{ pinD2, 8 },
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{ pinF6, 9 },
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{ pinF7, 10 },
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{ pinB2, 11 },
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{ pinD0, 12 },
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{ pinB0, 13 },
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{ pinB6, 14 },
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{ pinB1, 15 },
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{ pinB3, 16 },
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*/
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// -- scanRow_powrCol Example and scanCol_powrRow Example --
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// The example is the same, as the difference is whether the row or col is powered, and the other is used to detect the signal
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{ scanMode, pinF0, pinF4, pinB7, pinD3, pinF5, pinF1, pinD1, pinD2 },
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{ pinF6, 1, 2, 3, 4, 5, 6, 7, 8 },
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{ pinF7, 9, 10, 11, 12, 13, 14, 15, 16 },
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{ pinB2, 17, 20, 30, 40, 50, 60, 59, 38 },
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{ pinD0, 18, 21, 31, 41, 51, 61, 67, 39 },
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{ pinB0, 19, 22, 32, 42, 52, 62, 68, 47 },
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{ pinB6, 27, 23, 33, 43, 53, 63, 69, 48 },
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{ pinB1, 28, 24, 34, 44, 54, 64, 0, 49 }, // 0 signifies no key at that location
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{ pinB3, 29, 25, 35, 45, 55, 65, 0, 57 },
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{ pinA0, 37, 26, 36, 46, 56, 66, 0, 58 },
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// -- scanDual Example --
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// The example is the same as the previous one, but uses both columns and rows to power and detect, needed for non-NKRO matrices.
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/*
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{ scanMode, pinF0, pinF4, pinB7, pinD3, pinF5, pinF1, pinD1, pinD2 },
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{ pinF6, 1, 2, 3, 4, 5, 6, 7, 8 },
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{ pinF7, 9, 10, 11, 12, 13, 14, 15, 16 },
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{ pinB2, 17, 20, 30, 40, 50, 60, 59, 38 },
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{ pinD0, 18, 21, 31, 41, 51, 61, 67, 39 },
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{ pinB0, 19, 22, 32, 42, 52, 62, 68, 47 },
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{ pinB6, 27, 23, 33, 43, 53, 63, 69, 48 },
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{ pinB1, 28, 24, 34, 44, 54, 64, 0, 49 }, // 0 signifies no key at that location
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{ pinB3, 29, 25, 35, 45, 55, 65, 0, 57 },
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{ pinA0, 37, 26, 36, 46, 56, 66, 0, 58 },
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*/
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};
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@ -37,6 +37,7 @@
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// ----- Macros -----
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// -- pinSetup Macros --
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#define REG_SET(reg) reg |= (1 << ( matrix[row*(MAX_ROW_SIZE+1)+col] % 10 ) )
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#define PIN_SET_COL(pin) \
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@ -69,9 +70,34 @@
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case pin##pinLetter##6: \
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case pin##pinLetter##7
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// -- Column Scan Macros --
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#define PIN_TEST_COL(pin) \
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if ( !( pin & ( 1 << ( matrix[0*(MAX_ROW_SIZE+1)+col] % 10 ) ) ) ) \
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detectArray[matrix[row*(MAX_ROW_SIZE+1)+col]]++; \
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scanCode = matrix[row*(MAX_ROW_SIZE+1)+col]; \
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if ( scanCode && !( pin & ( 1 << ( matrix[0*(MAX_ROW_SIZE+1)+col] % 10 ) ) ) ) \
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detectArray[scanCode]++; \
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break
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// -- Row Scan Macros --
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#define PIN_TEST_ROW(pin) \
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scanCode = matrix[row*(MAX_ROW_SIZE+1)+col]; \
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if ( scanCode && !( pin & ( 1 << ( matrix[row*(MAX_ROW_SIZE+1)+0] % 10 ) ) ) ) \
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detectArray[scanCode]++; \
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break
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// -- Scan Dual Macros --
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#define PIN_DUALTEST_ROW(pin) \
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scanCode = matrix[row*(MAX_ROW_SIZE+1)+col]; \
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if ( scanCode \
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&& !( pin & ( 1 << ( matrix[row*(MAX_ROW_SIZE+1)+0] % 10 ) ) ) \
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&& detectArray[scanCode] & 0x01 ) \
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{ \
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detectArray[scanCode]++; \
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} \
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else \
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{ \
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if ( detectArray[scanCode] & 0x01 ) \
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detectArray[scanCode]--; \
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} \
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break
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@ -193,15 +219,21 @@ inline void matrix_pinSetup( uint8_t *matrix )
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PORTF = portF;
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}
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// TODO Proper matrix scanning
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// Scans the given matrix determined by the scanMode method
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inline void matrix_scan( uint8_t *matrix, uint8_t *detectArray )
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{
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// Column Scan
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#if scanMode == scanCol
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// Loop variables for all modes
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uint16_t col = 1;
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uint16_t row = 1;
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for ( ; col < (MAX_ROW_SIZE+1) + 1; col++ )
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uint16_t scanCode = 0;
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// Column Scan and Column Scan, Power Row
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#if scanMode == scanCol || scanMode == scanCol_powrRow
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for ( ; row < (MAX_COL_SIZE+1); row++ ) for ( ; col < (MAX_ROW_SIZE+1); col++ )
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{
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// Scan over the pins for each of the columns, and using the pin alias to determine which pin to set
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// (e.g. / 10 is for the pin name (A,B,C,etc.) and % 10 is for the position of the pin (A1,A2,etc.))
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switch ( matrix[0*(MAX_ROW_SIZE+1)+col] / 10 )
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{
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#if defined(__AVR_AT90USB1286__)
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@ -220,22 +252,88 @@ inline void matrix_scan( uint8_t *matrix, uint8_t *detectArray )
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PIN_TEST_COL(PINF);
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}
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}
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#endif
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#endif // scanMode
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// Row Scan
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#if scanMode == scanRow
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#endif
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// Column Scan, Power Row
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#if scanMode == scanCol_powrRow
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// Row Scan and Row Scan, Power Row
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#if scanMode == scanRow || scanMode == scanRow_powrCol
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for ( ; col < (MAX_ROW_SIZE+1); col++ ) for ( ; row < (MAX_COL_SIZE+1); row++ )
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{
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// Scan over the pins for each of the rows, and using the pin alias to determine which pin to set
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// (e.g. / 10 is for the pin name (A,B,C,etc.) and % 10 is for the position of the pin (A1,A2,etc.))
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switch ( matrix[row*(MAX_ROW_SIZE+1)+0] / 10 )
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{
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#if defined(__AVR_AT90USB1286__)
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case 0: // PINA
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PIN_TEST_ROW(PINA);
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#endif
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case 1: // PINB
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PIN_TEST_ROW(PINB);
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case 2: // PINC
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PIN_TEST_ROW(PINC);
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case 3: // PIND
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PIN_TEST_ROW(PIND);
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case 4: // PINE
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PIN_TEST_ROW(PINE);
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case 5: // PINF
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PIN_TEST_ROW(PINF);
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}
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}
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#endif // scanMode
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// Row Scan, Power Column
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#if scanMode == scanRow_powrCol
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#endif
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// Dual Scan
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#if scanMode == scanDual
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// First do a scan of all of the columns, marking each one
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for ( ; row < (MAX_COL_SIZE+1); row++ ) for ( ; col < (MAX_ROW_SIZE+1); col++ )
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{
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// Scan over the pins for each of the columns, and using the pin alias to determine which pin to set
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// (e.g. / 10 is for the pin name (A,B,C,etc.) and % 10 is for the position of the pin (A1,A2,etc.))
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switch ( matrix[0*(MAX_ROW_SIZE+1)+col] / 10 )
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{
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#if defined(__AVR_AT90USB1286__)
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case 0: // PINA
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PIN_TEST_COL(PINA);
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#endif
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case 1: // PINB
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PIN_TEST_COL(PINB);
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case 2: // PINC
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PIN_TEST_COL(PINC);
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case 3: // PIND
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PIN_TEST_COL(PIND);
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case 4: // PINE
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PIN_TEST_COL(PINE);
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case 5: // PINF
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PIN_TEST_COL(PINF);
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}
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}
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// Next, do a scan of all of the rows, clearing any "vague" keys (only detected on row, but not column, or vice-versa)
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// And marking any keys that are detected on the row and column
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col = 1;
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row = 1;
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for ( ; col < (MAX_ROW_SIZE+1); col++ ) for ( ; row < (MAX_COL_SIZE+1); row++ )
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{
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// Scan over the pins for each of the rows, and using the pin alias to determine which pin to set
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// (e.g. / 10 is for the pin name (A,B,C,etc.) and % 10 is for the position of the pin (A1,A2,etc.))
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switch ( matrix[row*(MAX_ROW_SIZE+1)+0] / 10 )
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{
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#if defined(__AVR_AT90USB1286__)
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case 0: // PINA
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PIN_DUALTEST_ROW(PINA);
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#endif
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case 1: // PINB
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PIN_DUALTEST_ROW(PINB);
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case 2: // PINC
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PIN_DUALTEST_ROW(PINC);
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case 3: // PIND
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PIN_DUALTEST_ROW(PIND);
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case 4: // PINE
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PIN_DUALTEST_ROW(PINE);
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case 5: // PINF
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PIN_DUALTEST_ROW(PINF);
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}
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}
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#endif
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}
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@ -76,10 +76,17 @@ inline void scan_setup()
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inline uint8_t scan_loop()
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{
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// Check count to see if the sample threshold may have been reached, otherwise collect more data
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if ( scan_count++ < MAX_SAMPLES )
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if ( scan_count < MAX_SAMPLES )
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{
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matrix_scan( (uint8_t*)matrix_pinout, KeyIndex_Array );
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// scanDual requires 2 passes, and thus needs more memory per matrix_scan pass
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#if scanMode == scanDual
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scan_count += 2;
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#else
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scan_count++;
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#endif
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// Signal Main Detection Loop to continue scanning
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return 0;
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}
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